Title :
BIST based communication system
Author :
Jain, Rita ; Gupta, M.K.
Author_Institution :
Dept. of Electron. & Commun. Eng., Lakshmi Narain Coll. of Technol., Bhopal, India
Abstract :
Built-in self-test techniques have been widely researched and adopted for reasons of improvements in test time and test cost, reduction in test resources required for test of large chips with embedded cores, and for field testability. While the adoption of these techniques is becoming prevalent, there continue to be challenges in making BIST solutions comprehensive to meet several design and application constraints. This paper describes the use of BIST implementations for self-test of a communication system, to support field testability. Novel aspects of this solution include (i) full off-line testing of the link and system, (ii) partial online testing, and (iii) support for various network management functions.
Keywords :
built-in self test; integrated circuit testing; BIST based communication system; built-in self-test technique; field testability; full off-line testing; partial online testing; test cost; test time; Built-in self-test; Circuit faults; Communication systems; Generators; Hardware; Multiplexing; Block Code; Built-in Self-test; Communication System; Demultiplexer; Linear Feedback Shift Register; Multiplexer; Pseudo Random Bit Sequence;
Conference_Titel :
Recent Advances in Intelligent Computational Systems (RAICS), 2011 IEEE
Conference_Location :
Trivandrum
Print_ISBN :
978-1-4244-9478-1
DOI :
10.1109/RAICS.2011.6069362
