DocumentCode :
2234194
Title :
The influence of top electrode on 0.6(Bi0.85La0.15)FeO3-0.4PbTiO3 thin film
Author :
Yang, Wufeng ; Yu, Shengwen ; Yuan, Bingrong ; Zhou, Xiaowen ; Cheng, Jinrong
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
fYear :
2009
fDate :
23-27 Aug. 2009
Firstpage :
1
Lastpage :
4
Abstract :
The exhibiting electrical properties of ferroelectric thin films usually are influenced by the electrode materials. In this paper, platinum (Pt), gold (Au) are selected as the top electrode materials for 0.6(Bi0.85La0.15)FeO3-0.4PbTiO3 (BLFO-PT) thin films. The Pt and Au electrodes were prepared by sputtering technique and annealed at 350degC. The effect of the top electrode materials is analyzed. The dielectric constants and loss factors of these thin films were checked under different temperatures. It shows that not only the Curie temperature of the films but also the dielectric behavior during the heating and cooling procedure carried out in the films is influenced by top electrode.
Keywords :
annealing; bismuth compounds; cooling; dielectric losses; electrochemical electrodes; ferroelectric Curie temperature; ferroelectric thin films; gold; heating; lanthanum compounds; lead compounds; materials preparation; permittivity; platinum; sputter deposition; Au-(Bi0.85La0.15)FeO3-PbTiO3-Pt; Curie temperature; Pt-(Bi0.85La0.15)FeO3-PbTiO3-Pt; annealing; cooling; dielectric constants; electrical properties; electrode materials; ferroelectric thin films; heating; loss factors; material preparation; sputtering technique; temperature 350 C; Annealing; Dielectric materials; Dielectric thin films; Electrodes; Ferroelectric materials; Gold; Platinum; Sputtering; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location :
Xian
ISSN :
1099-4734
Print_ISBN :
978-1-4244-4970-5
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2009.5307582
Filename :
5307582
Link To Document :
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