Title :
Sub-wavelength measurements of the near-field of a metal aperture
Author :
Adam, A.J.L. ; Seo, M.A. ; Ahn, K.J. ; Kim, D.S. ; Kang, J.H. ; Park, Q.H. ; Nagel, M. ; Planken, P. C M
Author_Institution :
Fac. of Appl. Sci., Univ. of Technol. Delft, Delft
Abstract :
We present results on THz near-field measurements of sub-wavelength apertures in metal films. Our results allow us to test, with unprecedented detail, the near-field predictions made by the well-known Bethe-Bouwkamp model.
Keywords :
metallic thin films; submillimetre wave spectra; Bethe-Bouwkamp model; THz near-field measurements; metal films; subwavelength metal aperture; Apertures; Electric variables measurement; Extraterrestrial measurements; Nonlinear optics; Optical films; Optical microscopy; Optical scattering; Pulse measurements; Spectroscopy; Ultrafast optics; (110.3080) Infrared imaging; (180.4243) Near-field microscopy; (300.6270) Spectroscopy, far-infrared; (320.7160) Ultrafast Technology;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
