Title :
A parameterized inversion model for soil moisture and biomass from polarimetric backscattering coefficients
Author :
Truong-Loï, My-Linh ; Saatchi, Sassan ; Jaruwatanadilok, Sermsak
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A semi-empirical algorithm for the retrieval of soil moisture, root mean square (RMS) height and biomass from polarimetric SAR data is explained and analyzed in this paper. The algorithm is a simplification of the distorted Born model. It takes into account the physical scattering phenomenon and has three major components: volume, double-bounce and surface. This simplified model uses the three backscattering coefficients (σHH, σHV and σVV) at low-frequency (P-band). The inversion process uses the Levenberg-Marquardt non-linear least-squares method to estimate the structural parameters. The estimation process is entirely explained in this paper, from initialization of the unknowns to retrievals. A sensitivity analysis is also done where the initial values in the inversion process are varying randomly. The results show that the inversion process is not really sensitive to initial values and a major part of the retrievals has a root-mean-square error lower than 5% for soil moisture, 24 Mg/ha for biomass and 0.49 cm for roughness, considering a soil moisture of 40%, roughness equal to 3cm and biomass varying from 0 to 500 Mg/ha with a mean of 161 Mg/ha.
Keywords :
radar polarimetry; soil; Levenberg-Marquardt nonlinear least-squares method; RMS height; backscattering coefficients; biomass; distorted Born model; inversion process; parameterized inversion model; physical scattering phenomenon; polarimetric SAR data; polarimetric backscattering coefficients; root-mean-square error; semiempirical algorithm; soil moisture; Backscatter; Biological system modeling; Biomass; Rough surfaces; Scattering; Soil moisture; Surface roughness; Soil moisture; biomass; polarimetry; roughness;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6352452