Title :
Improving on-line BIST-based diagnosis for roving STARs
Author :
Abramovici, Miron ; Stroud, Charles ; Skaggs, Brandon ; Emmert, John
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
Abstract :
We present improvements to our on-line BIST-based diagnosis technique originally used in the roving STARs approach. The enhanced technique starts with a new method of analyzing the BIST results, and employs the original divide-and-conquer method as a second phase only when the first phase fails or it does not achieve maximum diagnostic resolution. The combined technique significantly reduces the diagnosis time, improves the resolution in several cases, and also requires less fault-free resources
Keywords :
automatic testing; built-in self test; divide and conquer methods; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; combined technique; diagnosis time reduction; divide/conquer method; maximum diagnostic resolution; online BIST-based diagnosis; online FPGA testing; roving STARs; Built-in self-test; Control systems; Design optimization; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Logic testing; Process control; Runtime; Tiles;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856608
