Title :
A novel approach to fault diagnostics and prognostics
Author :
Kwan, C. ; Zhang, X. ; Xu, R. ; Haynes, L.
Author_Institution :
Intelligent Autom., Inc., Rockville, MD, USA
Abstract :
A novel fault diagnostics and prognostics algorithm based on hidden Markov model (HMM) is proposed. The algorithm combines fault diagnostics and prognostics in a unified framework. The algorithm has been fully tested by using experimental data from a rotating shift testbed in our laboratory.
Keywords :
fault location; fault simulation; hidden Markov models; machine testing; fault diagnostics; fault prognostics; hidden Markov model; rotating shaft testbed; Aircraft; Automation; Failure analysis; Fault diagnosis; Hidden Markov models; Inspection; Laboratories; Safety; Shafts; Testing;
Conference_Titel :
Robotics and Automation, 2003. Proceedings. ICRA '03. IEEE International Conference on
Print_ISBN :
0-7803-7736-2
DOI :
10.1109/ROBOT.2003.1241660
