Title :
An overview of the applications of a pulsed laser system for SEU testing
Author :
Pouget, V. ; Fouillat, P. ; Lewis, D. ; Lapuyade, H. ; Sarger, L. ; Roche, F.M. ; Duzellier, S. ; Ecoffet, R.
Author_Institution :
IXL, Bordeaux I Univ., Talence, France
Abstract :
This paper presents several recent results concerning single-event upset testing with a pulsed laser. It includes sensitivity mapping of an test SRAM cell, slave-induced upset in a flip-flop, MBU mapping of a 16 Mbit DRAM, and online testing of a sequencer-counter
Keywords :
automatic testing; digital integrated circuits; flip-flops; integrated circuit testing; integrated logic circuits; integrated memory circuits; measurement by laser beam; radiation effects; DRAM; MBU mapping; SEU testing; SRAM cell; flip-flop; online testing; pulsed laser system; sensitivity mapping; sequencer-counter; single-event upset testing; slave-induced upset; Circuit analysis; Circuit testing; Electronic equipment testing; Optical pulse generation; Optical pulses; Particle tracking; Pulsed laser deposition; Random access memory; Single event upset; System testing;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856612
