• DocumentCode
    2234911
  • Title

    Dynamic analysis of an SOI based CMUT

  • Author

    Zure, Tugrul ; Hernandez, Jonathan ; Chowdhury, Sazzadur

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Windsor, Windsor, ON, Canada
  • fYear
    2012
  • fDate
    19-21 March 2012
  • Firstpage
    539
  • Lastpage
    544
  • Abstract
    An SOI based hyperbolic paraboloid geometry capacitive micromachined ultrasonic transducer (CMUT) array has been fabricated to realize a frequency independent constant beamwidth broadband beamforming capability. Detailed fabrication and packaging techniques are presented. A Polytec laser Doppler vibrometer has been used to measure the transient and steady-state response of individual CMUT cells. The measured dynamic response results are in excellent agreement with analytical and 3-D electromechanical finite element analysis results. Experimental measurement also shows that the fabricated CMUTs exhibit a flat bandwidth within the specified frequency range. SEM inspection also shows very close agreement between mask features and fabricated geometry that ensures reproducibility of the device with a high degree of fidelity. The CMUT array has been designed for automotive blindspot detection application and works in the 113-167 kHz range.
  • Keywords
    automotive electronics; finite element analysis; inspection; scanning electron microscopy; silicon-on-insulator; ultrasonic transducer arrays; vibration measurement; 3D electromechanical finite element analysis; CMUT array; Polytec laser Doppler vibrometer; SEM inspection; SOl based hyperbolic paraboloid geometry; automotive blindspot detection application; broadband beamforming capability; capacitive micromachined ultrasonic transducer array; fabrication; frequency independent constant beamwidth; packaging techniques; silicon-on-insulator; Capacitance; Chromium; Conductivity; Fabrication; Gold; Lasers; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology (ICIT), 2012 IEEE International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4673-0340-8
  • Type

    conf

  • DOI
    10.1109/ICIT.2012.6209994
  • Filename
    6209994