• DocumentCode
    2234925
  • Title

    Terahertz spectroscopy of Ni-Ti alloy thin films

  • Author

    Jameson, A.D. ; Tomaino, J.L. ; Kevek, J.W. ; Paul, M.J. ; Hemphill-Johnston, M. ; Ong, J. ; Koretsky, M.D. ; Minot, E.D. ; Lee, Yun-Shik

  • Author_Institution
    Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Using THz spectroscopy, we obtained the resistivity of Ni-Ti alloy thin-films as a function of Ti concentration. The resistivity sharply increases near the phase transition boundaries, Ti concentrations of 22%, 44% and 62%.
  • Keywords
    nickel alloys; optical properties; phase transformations; terahertz spectroscopy; terahertz wave imaging; titanium alloys; NiTi; alloy thin films; phase transition boundaries; terahertz spectroscopy; Conductivity; Metals; Optical films; Optical imaging; Optical pulses; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5950414
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2234925