Title :
On-line current testing for a microprocessor based application with an off-chip sensor
Author :
Alorda, B. ; De Paul, I. ; Segura, J. ; Miller, T.
Author_Institution :
Univ. de les Illes Balears, Palma de Mallorca, Spain
Abstract :
This work presents a prototype architecture that provides on-line IDDQ measurement for a microprocessor-based system. It has been implemented using an IDDQ testable microprocessor (the Intel 386TM EX embedded microprocessor) and an off-chip current sensor. Three current test activation modes are supported. A direct test mode through a sensor dedicated pin, a test mode where the microprocessor controls the off-chip sensor, and a P1149.1 driven test. Measurements and architecture operation are detailed
Keywords :
CMOS digital integrated circuits; embedded systems; integrated circuit measurement; integrated circuit testing; microprocessor chips; IDDQ measurement; Intel 386 EX; P1149.1 driven test; direct test mode; embedded microprocessor; microprocessor based application; off-chip current sensor; on-line current testing; sensor dedicated pin; test activation modes; test mode; Automatic control; Circuit testing; Counting circuits; Current measurement; Microprocessors; Monitoring; Performance evaluation; Production; Sensor phenomena and characterization; Voltage;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856617
