On-line current testing for a microprocessor based application with an off-chip sensor

Author

Alorda, B. ; De Paul, I. ; Segura, J. ; Miller, T.

Author_Institution

Univ. de les Illes Balears, Palma de Mallorca, Spain

fYear

2000

fDate

2000

Firstpage

87

Lastpage

91

Abstract

This work presents a prototype architecture that provides on-line IDDQ measurement for a microprocessor-based system. It has been implemented using an IDDQ testable microprocessor (the Intel 386^TM EX embedded microprocessor) and an off-chip current sensor. Three current test activation modes are supported. A direct test mode through a sensor dedicated pin, a test mode where the microprocessor controls the off-chip sensor, and a P1149.1 driven test. Measurements and architecture operation are detailed

Keywords

CMOS digital integrated circuits; embedded systems; integrated circuit measurement; integrated circuit testing; microprocessor chips; IDDQ measurement; Intel 386 EX; P1149.1 driven test; direct test mode; embedded microprocessor; microprocessor based application; off-chip current sensor; on-line current testing; sensor dedicated pin; test activation modes; test mode; Automatic control; Circuit testing; Counting circuits; Current measurement; Microprocessors; Monitoring; Performance evaluation; Production; Sensor phenomena and characterization; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International

Conference_Location

Palma de Mallorca

Print_ISBN

0-7695-0646-1

Type

conf

DOI

10.1109/OLT.2000.856617

Filename

856617