Title :
1-V fast IDDQ current sensor for on-line mixed-signal/analog test
Author :
Margala, M. ; Dragic, S. ; Elabasiry, A. ; Ekpe, S. ; Stopjaková, V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper proposes a novel, ultra low-voltage design of a built-in current sensor for testing mixed-signal circuits. Designed in 0.18 μ CMOS technology, the monitor is based on the principle of a current mirror that is supported by the converting and output stages. The design is easily applicable in testing mixed-signal circuits. The sensor is designed for the power supply of 1.0 V that offers acceptance in low-voltage test applications. Presented results demonstrate excellent performances of the on-chip monitor
Keywords :
CMOS integrated circuits; built-in self test; current mirrors; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; 0.18 micron; 1 V; CMOS technology; built-in current sensor; current mirror; fast IDDQ current sensor; low-voltage test applications; on-chip monitor; on-line mixed-signal/analog test; ultra low-voltage design; Circuits; Inverters; MOSFETs; Mirrors; Monitoring; Resistors; Signal processing; Switches; Testing; Voltage;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856618
