Title :
A compact built-in current sensor for IDDQ testing
Author :
Tsiatouhas, Y. ; Haniotakis, Th ; Nikolos, D.
Author_Institution :
Dept. of Comput. Eng. & Inf., Patras Univ., Greece
Abstract :
In this paper a simple to implement, compact, build-in current sensor for IDDQ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line IDDQ testing
Keywords :
CMOS integrated circuits; VLSI; built-in self test; current mirrors; integrated circuit testing; CMOS; IDDQ testing; VLSI; built-in current sensor; current mirroring techniques; detection times; off-line testing; on-line testing; Testing;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856619
