• DocumentCode
    2235106
  • Title

    Picometrology of ultra-thin gold film by spinning-disc interferometry

  • Author

    Wang, Xuefeng ; Nolte, D.D.

  • Author_Institution
    Dept. of Phys., Purdue Univ., West Lafayette, IN
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We obtain the complex refractive index of ultra-thin gold film (down to 20 picometers) on thermal oxide on silicon by the combination of in-line (IL) and differential-phase-contrast (DPC) channels of spinning-disc interferometry (SDI).
  • Keywords
    gold; high-speed optical techniques; light interferometry; measurement by laser beam; metallic thin films; refractive index; Au; complex refractive index; differential-phase-contrast channels; in-line channels; picometrology; spinning-disc interferometry; thermal oxide; ultrathin gold film; Biomedical optical imaging; Gold; High speed optical techniques; Optical films; Optical interferometry; Optical refraction; Optical sensors; Optical variables control; Refractive index; Substrates; (120.3180) Interferometry; (310.6860) Thin films, optical properties;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4571412