DocumentCode :
2235347
Title :
Model based test case generation for distributed embedded systems
Author :
Chimisliu, Valentin ; Wotawa, Franz
Author_Institution :
Inst. for Software Technol., Univ. of Technol. Graz, Graz, Austria
fYear :
2012
fDate :
19-21 March 2012
Firstpage :
656
Lastpage :
661
Abstract :
As test case creation activities consume an increasing amount of resources allocated to software development projects, the need to automate this task as much as possible becomes more and more stringent. In this article we report on the application of academic test case generation tools in an industrial context. We present an approach to generate test cases from reactive distributed systems specified as asynchronously communicating UML statecharts. We employ two approaches for the generation process. The first one is fully automated and generates test cases aimed at transition coverage. The second one requires the intervention of the tester in order to annotate states and/or transitions partially describing a test scenario. It is the job of the tool to compute test cases pertaining to the specified test scenario.
Keywords :
Unified Modeling Language; embedded systems; program testing; software development management; academic test case generation tools; asynchronously communicating UML statecharts; distributed embedded systems; industrial context; model based test case generation; reactive distributed systems; software development projects; test case creation activities; Hazards; Logic gates; Unified modeling language; LOTOS; UML statecharts; test case generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology (ICIT), 2012 IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4673-0340-8
Type :
conf
DOI :
10.1109/ICIT.2012.6210013
Filename :
6210013
Link To Document :
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