DocumentCode
2235347
Title
Model based test case generation for distributed embedded systems
Author
Chimisliu, Valentin ; Wotawa, Franz
Author_Institution
Inst. for Software Technol., Univ. of Technol. Graz, Graz, Austria
fYear
2012
fDate
19-21 March 2012
Firstpage
656
Lastpage
661
Abstract
As test case creation activities consume an increasing amount of resources allocated to software development projects, the need to automate this task as much as possible becomes more and more stringent. In this article we report on the application of academic test case generation tools in an industrial context. We present an approach to generate test cases from reactive distributed systems specified as asynchronously communicating UML statecharts. We employ two approaches for the generation process. The first one is fully automated and generates test cases aimed at transition coverage. The second one requires the intervention of the tester in order to annotate states and/or transitions partially describing a test scenario. It is the job of the tool to compute test cases pertaining to the specified test scenario.
Keywords
Unified Modeling Language; embedded systems; program testing; software development management; academic test case generation tools; asynchronously communicating UML statecharts; distributed embedded systems; industrial context; model based test case generation; reactive distributed systems; software development projects; test case creation activities; Hazards; Logic gates; Unified modeling language; LOTOS; UML statecharts; test case generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology (ICIT), 2012 IEEE International Conference on
Conference_Location
Athens
Print_ISBN
978-1-4673-0340-8
Type
conf
DOI
10.1109/ICIT.2012.6210013
Filename
6210013
Link To Document