DocumentCode :
2235642
Title :
Using discrete event simulation to analyze the impact of job priorities on cycle time in semiconductor manufacturing
Author :
Fronckowiak, David ; Peikert, Andreas ; Nishinohara, Kazumi
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1996
fDate :
12-14 Nov 1996
Firstpage :
151
Lastpage :
155
Abstract :
In the development and the manufacturing of semiconductors, wafer lots, which are groups of semiconductor wafers, are assigned different processing priorities based upon the required delivery time of these lots. In process development, experimental data is required which may necessitate the use of higher processing priorities on some lots so that the development of the process can proceed in a timely manner. Similarly, in manufacturing, customer requirements may dictate the use of higher priority lots to meet committed delivery dates. This paper uses the semiconductor manufacturing line simulator, ManSim/X, to analyze the impact of different percentages of “hot” lots on the cycle times of two different products that are in the manufacturing line. Rules-of-thumb can then be developed in allocating the amount of lots released which can contain a higher priority that do not significantly impact the overall cycle time of the product
Keywords :
discrete event simulation; electronic engineering computing; integrated circuit manufacture; production engineering computing; IC manufacturing; ManSim/X; cycle time; delivery time; discrete event simulation; job priorities; process development; processing priorities; semiconductor manufacturing line simulator; semiconductor wafers; wafer lots; Analytical models; CMOS process; Discrete event simulation; Manufacturing processes; Microelectronics; Production facilities; Pulp manufacturing; Semiconductor device manufacture; Semiconductor device modeling; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-3371-3
Type :
conf
DOI :
10.1109/ASMC.1996.557987
Filename :
557987
Link To Document :
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