DocumentCode
2235836
Title
Notice of Retraction
A Method of Improving Precision in Software Testing Based on Defect Patterns
Author
Jin Dahai ; Gong Yunzhan ; Xiao Qing ; Wang Yawen ; Yang Zhaohong
Author_Institution
State Key Lab. of Networking & Switching Technol., Beijing Univ. of Posts & Telecommun., Beijing
fYear
2009
fDate
24-25 April 2009
Firstpage
285
Lastpage
288
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This paper presents a method, control-flow interval iteration in presence of interprocedural side-effect analysis, to improve test precision in software testing based on defect patterns, then an exact interval computation can be used in defect test algorithm of DTS. Our experiment shows that the DTS, using this method, can reduce the false positive rate and drop defect rate effectively.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This paper presents a method, control-flow interval iteration in presence of interprocedural side-effect analysis, to improve test precision in software testing based on defect patterns, then an exact interval computation can be used in defect test algorithm of DTS. Our experiment shows that the DTS, using this method, can reduce the false positive rate and drop defect rate effectively.
Keywords
program testing; systems analysis; control-flow interval iteration; defect patterns; drop defect rate; false positive rate; interprocedural side-effect analysis; software testing; Communication industry; Computer industry; Industrial control; Information systems; Java; Laboratories; Pattern analysis; Software testing; System testing; Telecommunication switching; control flow interval iteration; defect patterns; interprocedural side-effect analysis; software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial and Information Systems, 2009. IIS '09. International Conference on
Conference_Location
Haikou
Print_ISBN
978-0-7695-3618-7
Type
conf
DOI
10.1109/IIS.2009.14
Filename
5116354
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