PRBS Test Signature Analysis of Switched Current Circuit

Author

Guo Jiegong ; Yigang, He ; Cai Xinhua

Author_Institution

Inst. of Inf. Technol., Hunan Univ. of Arts & Sci., Changde, China

fYear

2009

fDate

26-28 Dec. 2009

Firstpage

627

Lastpage

630

Abstract

A PRBS tested signature analysis method that is based on the excitation of the switched current circuits with pseudo random sequence and the subsequent analysis of the captured response is proposed in this paper. It has taken into account of the connection between special structural problems and CMOS´s parameters in switched current circuits such as the drain-gate capacitance Cdg, gate-source capacitance Cgs and transconductance gm. The fault detection capabilities of the test and data analysis methods demonstrated by applying them to variant switched current filter circuit.

Keywords

CMOS integrated circuits; fault diagnosis; filters; integrated circuit testing; switched current circuits; CMOS parameter; PRBS test signature analysis; drain gate capacitance; fault detection; gate-source capacitance; pseudo random sequence; structural problem; switched current circuit; switched current filter circuit; transconductance; Autocorrelation; Capacitance; Circuit faults; Circuit testing; Filters; Information analysis; Information science; Pulse measurements; Random sequences; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Information Science and Engineering (ICISE), 2009 1st International Conference on

Conference_Location

Nanjing

Print_ISBN

978-1-4244-4909-5

Type

conf

DOI

10.1109/ICISE.2009.842

Filename

5455663