DocumentCode
2236100
Title
Managing factory risk to improve customer satisfaction
Author
DePinto, Gary
Author_Institution
Motorola Inc., Austin, TX, USA
fYear
1996
fDate
12-14 Nov 1996
Firstpage
224
Lastpage
229
Abstract
Due to one single event that scrapped over 900 wafers, an approach was developed to prevent this type of catastrophic scrap from reoccurring. This factory-wide approach considered the affects of (1) People, Process and Methods; (2) Facilities; (3) Gases, Chemicals and other Source components. It also evaluated each individual process in extreme detail. This approach focused on measurable outputs to maintain process control. By implementing this approach of assessing factory risk, in-line scrap decreased by 27% over a one year period of time. In the 19 months since this approach was initiated, there has not been one in-line event that scrapped more than 375 wafers. Scrap reduction was accomplished by many different methods including increasing the sample frequency between measurable outputs, measuring product wafers where appropriate, modifying procedures including training, upgrading the factory infrastructure, adding tool sensorization, and applying SPC correctly
Keywords
factory automation; integrated circuit manufacture; production control; risk management; statistical process control; training; SPC; catastrophic scrap; customer satisfaction; factory infrastructure; factory risk management; factory-wide approach; individual process; measurable outputs; process control; sample frequency; scrap reduction; tool sensorization; training; Chemical processes; Customer satisfaction; Etching; Frequency measurement; Gases; Oxidation; Process control; Production facilities; Risk management; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-3371-3
Type
conf
DOI
10.1109/ASMC.1996.558005
Filename
558005
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