DocumentCode
2236396
Title
2007 ROCS Workshop [Title Page]
fYear
2007
fDate
14-14 Oct. 2007
Abstract
The following topics are dealt with: accelerated lifetest techniques; reliability studies of advanced HEMTs; reliability and failure analysis tools.
Keywords
failure analysis; high electron mobility transistors; life testing; semiconductor device reliability; semiconductor device testing; HEMT; accelerated lifetest techniques; compound semiconductors reliability; failure analysis tools; reliability analysis tools;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2007.[Reliability of Compound Semiconductors Digest]
Conference_Location
Portland, OR
Print_ISBN
978-0-7908-0115-5
Type
conf
DOI
10.1109/ROCS.2007.4391050
Filename
4391050
Link To Document