DocumentCode :
2236444
Title :
An IEEE 1500 compatible wrapper architecture for testing cores at transaction level
Author :
Refan, F. ; Prinetto, P. ; Navabi, Zainalabedin
Author_Institution :
ECE Dept., Univ. of Tehran, Tehran, Iran
fYear :
2008
fDate :
9-12 Oct. 2008
Firstpage :
178
Lastpage :
181
Abstract :
With the evolution of Electronic System Level (ESL) design methodologies, Transaction Level Modeling (TLM) is regarded as the next step in the direction of system level design. This requires definition of appropriate test strategies at this level including wrapper, scheduling and Test Access Mechanism (TAM) design. In this paper we propose a wrapper for core testing at transaction level, compatible with IEEE 1500 standard architecture. The proposed wrapper is designed to support communication with tlm_fifo as the basic primitive channel of SystemC TLM core. The wrapper is defined as a layer on top of standard IEEE 1500 architecture, including a controller to packetize and depacketize the test stimuli and responses. Controller design, and architecture configuration for serial and parallel core test instructions are presented. Using the same strategy other instructions can be implemented.
Keywords :
IEEE standards; logic design; logic testing; system-on-chip; ESL design methodology; IEEE 1500 standard architecture; core testing; electronic system level; parallel core test instruction; scheduling mechanism; serial core test instruction; test access mechanism; transaction level modeling; wrapper architecture; wrapper mechanism; Complexity theory; Hardware; Object oriented modeling; System-on-a-chip; Testing; Time domain analysis; Time varying systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (EWDTS), 2008 East-West
Conference_Location :
Lviv
Print_ISBN :
978-1-4244-3402-2
Electronic_ISBN :
978-1-4244-3403-9
Type :
conf
DOI :
10.1109/EWDTS.2008.5580141
Filename :
5580141
Link To Document :
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