• DocumentCode
    2238260
  • Title

    Use of high-resolution SAR intensity images for damage detection from the 2010 Haiti earthquake

  • Author

    Upret, Pralhad ; Yamazak, Fumio

  • Author_Institution
    Dept. of Urban Environ. Syst., Chiba Univ., Chiba, Japan
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    6829
  • Lastpage
    6832
  • Abstract
    Radar remote sensing, as in SAR, is an independent of daylight and cloud cover and hence has found wide applications including damage detection. The Haiti earthquake (Mw=7) on January 12, 2010 caused widespread casualty and extensive damage to structures including the capital city Port-au-Prince. 217,000 people lost their lives due to this event. Building damage detection was performed using very high-resolution pre- and post-event SAR imageries from TerraSAR-X. Radar characteristics like the correlation coefficient and the backscattering difference between the two SAR images taken in different times were calculated. To find out the building damage in the densely populated settlements as in Port-au-Prince, the threshold values of the correlation coefficient and backscattering difference were suggested and then efficiency of these thresholds was evaluated by overlaying on the optical satellite images. Then building damages could be observed even in the dense urban setting of Port-au-Prince.
  • Keywords
    earthquakes; radar imaging; remote sensing by radar; synthetic aperture radar; AD 2010 01 12; Haiti earthquake; Port-au-Prince dense urban setting; TerraSAR-X; cloud cover; correlation coefficient; damage detection; high-resolution SAR intensity images; optical satellite images; post-event SAR imagery; pre-event SAR imagery; radar characteristics; radar remote sensing; Abstracts; Cities and towns; Correlation; Europe; Geology; Image resolution; Radiometry; buildings; earthquake; feature extraction; loss measurement; radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6352595
  • Filename
    6352595