DocumentCode :
2238441
Title :
Comparison of high-frequency performance of quasi-SOI and conventional SOI power MOSFETs
Author :
Hiraoka, Yasushi ; Matsumoto, Satoshi ; Sakai, Tatsuo
Author_Institution :
NTT Telecommun. Energy Labs., Kanagawa, Japan
fYear :
2000
fDate :
2000
Firstpage :
161
Lastpage :
164
Abstract :
We have compared the radio-frequency performance of quasi-SOI and conventional SOI power MOSFETs based on experimentally obtained results and numerical simulation. The quasi-SOI power MOSFET proved to be superior because the activation of the parasitic bipolar transistor was suppressed. We clarified, through a numerical simulation, that the parasitic bipolar effect causes harmonics generation. Especially, the third-order intermodulation distortion of the quasi-SOI device was about 15 dBc lower than that of the conventional SOI device under 2 GHz operation
Keywords :
UHF field effect transistors; harmonic generation; power MOSFET; semiconductor device measurement; semiconductor device models; silicon-on-insulator; 2 GHz; Si-SiO2; conventional SOI power MOSFETs; harmonics generation; high-frequency performance; numerical simulation; parasitic bipolar transistor; quasi-SOI power MOSFETs; radio-frequency performance; third-order intermodulation distortion; Bipolar transistors; Circuit simulation; Electric variables measurement; Immune system; Impurities; Integrated circuit technology; MMICs; MOSFETs; Numerical simulation; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on
Conference_Location :
Toulouse
ISSN :
1063-6854
Print_ISBN :
0-7803-6269-1
Type :
conf
DOI :
10.1109/ISPSD.2000.856796
Filename :
856796
Link To Document :
بازگشت