DocumentCode :
2238795
Title :
Double-side packaged, high power IGBTs for improved thermal and switching characteristics
Author :
Zhao, Shanqi ; Sin, Johnny K O
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
fYear :
2000
fDate :
2000
Firstpage :
229
Lastpage :
232
Abstract :
This paper describes a new packaging technique for improving the thermal and switching characteristics of high power IGBTs. Two patterned DBC (Direct Bond Copper) substrates are used to contact the top and bottom of an IGBT chip. In this way, heat dissipation can take place on both sides of the device, and the wire-bonding between the emitter pad and the package electrode can be eliminated. Experimental results show that this packaging technique can improve the heat dissipation in an IGBT with approximately 84% increase in current handling capability and 33% decrease in steady-state thermal impedance. The packaging technique can also improve the frequency characteristics of the IGBT. At 10 kHz for example, there is approximately 37% increase in current handling capability. The improvement in switching characteristics is about 10% decrease in turn-off delay time and 20% decrease in fall time
Keywords :
insulated gate bipolar transistors; semiconductor device packaging; thermal management (packaging); 10 kHz; Cu; current handling; direct bond copper substrate; double-side packaging; heat dissipation; high power IGBT; switching characteristics; thermal impedance; Aluminum; Bonding; Ceramics; Copper; Electrodes; Electronic packaging thermal management; Heat sinks; Insulated gate bipolar transistors; Multichip modules; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on
Conference_Location :
Toulouse
ISSN :
1063-6854
Print_ISBN :
0-7803-6269-1
Type :
conf
DOI :
10.1109/ISPSD.2000.856813
Filename :
856813
Link To Document :
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