DocumentCode
2239283
Title
The determination of SPICE Gummel-Poon parameters by a merged optimization-extraction technique
Author
Seitchik, Jerold A. ; Machala, Charles F., III ; Yang, Ping
Author_Institution
Texas Instrum., Inc., Dallas, TX, USA
fYear
1989
fDate
18-19 Sep 1989
Firstpage
275
Lastpage
278
Abstract
A powerful and flexible bipolar characterization method is presented. The technique is based on a merging of the optimization and extraction approaches that allows; the advantages of both to be retained. Detailed discussions clarify how four aspects of the methodology alleviate the major bipolar parametrization problems. With these procedures a full model may be developed in under an hour. The physical nature of the parameters is retained by fitting to extensive data
Keywords
bipolar integrated circuits; bipolar transistors; circuit CAD; semiconductor device models; SPICE Gummel-Poon parameters; bipolar characterization method; full model; merged optimization-extraction technique; merging; parametrization; Bipolar transistors; Curve fitting; Data mining; Design optimization; Instruments; Process design; SPICE; Scattering parameters; Semiconductor process modeling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989
Conference_Location
Minneapolis, MN
Type
conf
DOI
10.1109/BIPOL.1989.69507
Filename
69507
Link To Document