DocumentCode
2239617
Title
Total Internal Reflection Microscopy for Surface Plasmon Scattering of a Single Cu Nanowire
Author
Yim, Sang-Youp ; Ahn, Hong-Gyu ; Kim, Dae-Geun ; Je, Koo-Chul ; Ju, Honglyoul ; Choi, Moohyun ; Park, Chang Woo ; Park, Seung-Han
Author_Institution
Nat. Res. Lab. of Nonlinear Opt., Yonsei Univ., Seoul
fYear
2007
fDate
26-31 Aug. 2007
Firstpage
1
Lastpage
2
Abstract
A total internal reflection microscope was constructed to study surface plasmon scattering spectra of a single Cu nanowire. In particular, we have observed a strong surface plasmon peak in deep red region and the red-shift of the surface plasmon resonance as the diameter increases.
Keywords
copper; nanowires; optical fabrication; optical microscopy; surface plasmons; Cu; internal reflection microscopy; nanowire; surface plasmon resonance; surface plasmon scattering; Copper; Glass; Optical microscopy; Optical reflection; Optical scattering; Optical surface waves; Plasmons; Resonance light scattering; Scanning electron microscopy; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-1173-3
Electronic_ISBN
978-1-4244-1174-0
Type
conf
DOI
10.1109/CLEOPR.2007.4391204
Filename
4391204
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