• DocumentCode
    2240096
  • Title

    Copper wire bond on MCM device (bond stitch on bump ball)

  • Author

    Tan Boo Wei ; Niu You Hua

  • Author_Institution
    Group Engineering Manager, Carsem Suzhou, China
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Abstract
    Copper wire bonding is becoming popular on multi chip (MCM) device in parallel with the general industry trend of integrating more functions into single product. In order to support device to device interconnect; bond stitch on ball (BSOB) bonding method is quite generally used in the industry. However, copper wire due to its material hardness is more difficult to be manufactured into BSOB as compared to gold wire. In this paper, key challenges for copper wire bond BSOB and its solutions are discussed. Problem solving methodology including copper material selection, bonding tool (capillary) design, bonding concept and special wire bond software features will be explored to develop robust process window for copper wire bonding with good reliability and production worthy.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh, Perak, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521750
  • Filename
    6521750