Symbolic optimization of FSM networks based on sequential ATPG techniques

Author

Ferrandi, Fabrizio ; Fummi, Franco ; Macii, Enrico ; Poncino, Massimo ; Sciuto, Donatella

Author_Institution

Dip. di Elettronica e Inf., Politecnico di Milano, Italy

fYear

1996

fDate

3-7 Jun, 1996

Firstpage

467

Lastpage

470

Abstract

This paper presents a novel optimization algorithm for FSM networks that relies on sequential test generation and redundancy removal. The implementation of the proposed approach, which is based on the exploitation of input don´t care sequences through regular language intersection, is fully symbolic. Experimental results, obtained on a large set of standard benchmarks, improve over the ones of state-of-the-art methods

Keywords

automatic test software; circuit optimisation; finite state machines; logic CAD; logic testing; reachability analysis; sequential circuits; FSM networks; finite state machines; input don´t care sequences; optimization algorithm; redundancy removal; regular language intersection; sequential ATPG techniques; sequential test generation; standard benchmarks; symbolic optimization; Automatic test pattern generation; Benchmark testing; Design automation; Design optimization; Feeds; Network synthesis; Pediatrics; Permission; Sequential analysis; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference Proceedings 1996, 33rd

Conference_Location

Las Vegas, NV

ISSN

0738-100X

Print_ISBN

0-7803-3294-6

Type

conf

DOI

10.1109/DAC.1996.545621

Filename

545621