DocumentCode :
2240178
Title :
Symbolic optimization of FSM networks based on sequential ATPG techniques
Author :
Ferrandi, Fabrizio ; Fummi, Franco ; Macii, Enrico ; Poncino, Massimo ; Sciuto, Donatella
Author_Institution :
Dip. di Elettronica e Inf., Politecnico di Milano, Italy
fYear :
1996
fDate :
3-7 Jun, 1996
Firstpage :
467
Lastpage :
470
Abstract :
This paper presents a novel optimization algorithm for FSM networks that relies on sequential test generation and redundancy removal. The implementation of the proposed approach, which is based on the exploitation of input don´t care sequences through regular language intersection, is fully symbolic. Experimental results, obtained on a large set of standard benchmarks, improve over the ones of state-of-the-art methods
Keywords :
automatic test software; circuit optimisation; finite state machines; logic CAD; logic testing; reachability analysis; sequential circuits; FSM networks; finite state machines; input don´t care sequences; optimization algorithm; redundancy removal; regular language intersection; sequential ATPG techniques; sequential test generation; standard benchmarks; symbolic optimization; Automatic test pattern generation; Benchmark testing; Design automation; Design optimization; Feeds; Network synthesis; Pediatrics; Permission; Sequential analysis; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference Proceedings 1996, 33rd
Conference_Location :
Las Vegas, NV
ISSN :
0738-100X
Print_ISBN :
0-7803-3294-6
Type :
conf
DOI :
10.1109/DAC.1996.545621
Filename :
545621
Link To Document :
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