Title :
Picosecond Time Resolved X-ray Diffraction Measurements of Coherent Phonons and Carrier Dynamics at a Buried Interface
Author :
Lee, S.H. ; Fritz, D.M. ; Sheu, Yu-Miin ; Goldman, R.S. ; Walko, Don ; Landhal, Eric ; Reis, D.A.
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Daejeon
Abstract :
We present time resolved X-ray diffraction (TRXD) experiments on the transport of a coherent acoustic wave-packet and nonlinear carrier relaxation processes across the nearly ideal AlGaAs/GaAs interface. A femtosecond laser impulsively excites the underlying substrate such that the coherent acoustic phonons take the form of two counter propagating unipolar strain pulses and associated hot carrier dynamics. Picosecond TRXD is used to observe the laser-induced strain separately for the film and substrate.
Keywords :
III-V semiconductors; X-ray diffraction; aluminium compounds; gallium arsenide; phonons; AlGaAs-GaAs; carrier dynamics; coherent acoustic wave-packet; coherent phonons; hot carrier dynamics; nonlinear carrier relaxation processes; picosecond time resolved X-ray diffraction; unipolar strain pulses; Acoustic diffraction; Acoustic measurements; Acoustic pulses; Acoustic waves; Capacitive sensors; Nonlinear acoustics; Phonons; Substrates; Time measurement; X-ray diffraction;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391239