DocumentCode
2240659
Title
Robust power package development with mechanical simulation and reliability validation
Author
Xueren Zhang ; Kim-Yong Goh ; Yiyi Ma ; Wingshenq Wong
Author_Institution
STMicroelectronics, 629 Lorong 4/6 Toa Payoh, Singapore 319521
fYear
2012
fDate
6-8 Nov. 2012
Firstpage
1
Lastpage
6
Abstract
Thermo-mechanical reliability is one of the major concerns for electronic packages, especially for power packages operating in extremely harsh environment. As the trends towards high density and function integration, advanced power device becomes more sensitive to environmental stress. Comprehensive study is needed from design, process to test towards robust power package with high reliability. In this paper, we will demonstrate the successful application of simulation in the development of a series of robust leaded power packages. Firstly, finite element analysis(FEA) has been carried out to understand die stress behavior inside the package during assembly and reliability tests, i.e. from die attach, post mold cure, reflow to thermal cycling etc. Then DOE matrix is run to obtain the critical responses to different factors, which leads to guidelines on package design and material selection. A series of robust power packages have been developed with optimized package geometry and bill of materials.
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location
Ipoh, Perak, Malaysia
ISSN
1089-8190
Print_ISBN
978-1-4673-4384-8
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2012.6521771
Filename
6521771
Link To Document