• DocumentCode
    2240950
  • Title

    Error propagation from OSL calibration standards: Analytical solution and experimental validation

  • Author

    Han, Yufeng

  • Author_Institution
    ENI products, MKS Instrum., Rochester, NY, USA
  • fYear
    2007
  • fDate
    8-8 June 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    OSL (Open-Short-Load) calibration is the commonly used technique for one-port RF reflection/impedance measurement. Generally, the calibration standards are assumed to be ¿perfect¿ or traceable to ¿perfect standards¿. With no doubts, the imperfections on calibration standards or process of traceability will create a second-level error for measurement. Recent attempts focus on predicting the second-level error with numerical simulations. However, direct analytical expression and experimental validation have not been demonstrated yet. In this paper, analytical solution to error propagation from OSL calibration standards is derived with introducing small perturbations to these standards and using first-order approximations. It leads to sensitivity analysis for OSL calibration with imperfect standards. In order to validate the analysis, a female-to-male adapter is adopted as an error source for OSL calibration standards. By comparing the reflection measurements for the cases of calibration with/without the adapter, the analytical solution is validated experimentally.
  • Keywords
    electric impedance measurement; error analysis; OSL calibration standards; error propagation; female-to-male adapter; one-port RF reflection/impedance measurement; open-short-load calibration; Calibration; Error analysis; Impedance measurement; Measurement standards; Numerical simulation; RF signals; Radio frequency; Reflection; Sensitivity analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference, 2007 69th
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-0-7803-9762-0
  • Electronic_ISBN
    978-0-7803-9763-7
  • Type

    conf

  • DOI
    10.1109/ARFTG.2007.5456334
  • Filename
    5456334