Abstract :
The following topics are dealt with: microprocessor test; delay fault testing; signal integrity; BIST; built-in self test; transistor aging; power supply noise; and integrated circuit chip.
Keywords :
ageing; built-in self test; circuit testing; microprocessor chips; transistors; built-in self test; delay fault testing; integrated circuit chip; microprocessor test; power supply noise; signal integrity; transistor aging;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
