DocumentCode
2241169
Title
Highly accurate frequency/time domain characterization of transmission lines and passives for SiP applications up to 65 GHz
Author
Wojnowski, Maciej ; Engl, Mario ; Weigel, Robert
Author_Institution
Infineon Technol. AG, Neubiberg, Germany
fYear
2007
fDate
8-8 June 2007
Firstpage
1
Lastpage
9
Abstract
Accurate determination of the characteristic impedance determines the accuracy of the characterization of transmission lines and passive devices. In this paper, we present a novel, time-domain based procedure for the complex characteristic impedance determination. The method is insensitive to changes in the reference plane and the parasitic shunt admittance at the probe tips. For highly accurate passives characterization, a modification of the Thru-Reflect-Line (TRL) calibration algorithm is proposed. It enables the use of the TRL method to de-embed components having the ports on different metallization levels. Additionally, a comprehensive overview and evaluation of both frequency and time-domain methods for characteristic impedance determination is included for completeness. We present measurement results of transmission lines and spiral inductors fabricated in MCM-D technology on low-and high-resistivity substrates up to 65 GHz.
Keywords
calibration; electric impedance measurement; system-in-package; transmission lines; MCM-D technology; SiP; characteristic impedance; spiral inductors; system-in-package; thru-reflect-line calibration algorithm; transmission lines; Admittance; Calibration; Frequency; Impedance; Metallization; Probes; Shunt (electrical); Time domain analysis; Transmission line measurements; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference, 2007 69th
Conference_Location
Honolulu, HI
Print_ISBN
978-0-7803-9762-0
Electronic_ISBN
978-0-7803-9763-7
Type
conf
DOI
10.1109/ARFTG.2007.5456341
Filename
5456341
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