Title :
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects
Author :
Houarche, N. ; Comte, M. ; Renovell, M. ; Czutro, A. ; Engelke, P. ; Polian, I. ; Becker, B.
Author_Institution :
LIRMM, UMII, Montpellier, France
Abstract :
In this paper a new electrical model is proposed to be used in fault size based fault simulation of crosstalk aggravated resistive short defects. The electrical behavior of the defect is first described and analyzed in details. Then an electrical model is proposed allowing to efficiently compute the critical resistance determining the range of detectable short resistance. The model is validated by comparison with SPICE simulations.
Keywords :
crosstalk; electric resistance; electrical faults; fault simulation; SPICE simulation; aggravated resistive short defect; crosstalk; delay faults; detectable short resistance; electrical behavior; electrical model; fault simulation; fault size; Crosstalk; Delay; Defect model; Test; VLSI; fault simultion;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.57
