• DocumentCode
    2241601
  • Title

    Cache performance of chronological garbage collection

  • Author

    Ding, Yuping ; Li, Xining

  • Author_Institution
    Dept. of Comput. Sci., Lakehead Univ., Thunder Bay, Ont., Canada
  • Volume
    1
  • fYear
    1998
  • fDate
    24-28 May 1998
  • Firstpage
    1
  • Abstract
    The paper presents the cache performance analysis of the Chronological Garbage Collection algorithm used in the LVM system. The LVM is a new Logic Virtual Machine for Prolog. It adopts one stack policy for all dynamic memory requirements and cooperates with an efficient garbage collection algorithm, Chronological Garbage Collection to recuperate space, not as deliberate garbage collection operation but as a natural activity of the LVM engine to gather useful objects. This algorithm takes advantages of the traditional copying, mark-compact, generational, and incremental garbage collection schemes. In order to determine the improvement of cache performance under our garbage collection algorithm, we developed an emulator to do the trace driven cache simulation. Direct mapped cache and set-associative cache with different cache sizes, block sizes and set associativities are simulated and measured. The objectives of this simulation are to verify and validate our experimental results, and to find important factors which influence the performance of the CGC algorithm
  • Keywords
    PROLOG; cache storage; logic programming; performance evaluation; storage management; virtual machines; CGC algorithm; LVM engine; LVM system; Logic Virtual Machine; Prolog; block sizes; cache performance; cache performance analysis; cache sizes; chronological garbage collection; direct mapped cache; dynamic memory requirements; emulator; garbage collection algorithm; incremental garbage collection schemes; set associativities; set-associative cache; stack policy; trace driven cache simulation; Algorithm design and analysis; Computer science; Data structures; Engines; Functional programming; Lakes; Logic programming; Performance analysis; Semiconductor device measurement; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 1998. IEEE Canadian Conference on
  • Conference_Location
    Waterloo, Ont.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-4314-X
  • Type

    conf

  • DOI
    10.1109/CCECE.1998.682534
  • Filename
    682534