• DocumentCode
    2241739
  • Title

    Signal sensitivity to supply noise on high-speed I/O

  • Author

    Siang Rui Chan ; Fern Nee Tan ; Mohd-Mokhtar, Rosmiwati

  • Author_Institution
    Intel Microelectron. (M) Sdn. Bhd, Bayan Lepas, Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Power Distribution Network (PDN) is optimized based on conventional AC and DC noise target specification. Large supply noise occurs due to increase in speed and number of I/O running simultaneously. In this paper, an alternate means to quantify supply noise to signal performance is discussed. Discussion focuses on signal performance impact caused by supply noise with different frequency content. Simulation is carried out using transistor model and findings are then correlated through lab measurements. Using USB I/O as a test case, findings conclude that the USB transmitter performance is less sensitive to supply noise at circuit operating frequency (480 MHz) and its harmonic. Hence, excessive AC noise at its less sensitive region will not cause signal eye diagram to fail.
  • Keywords
    UHF transistors; semiconductor device models; semiconductor device noise; sensitivity analysis; transistors; AC noise target specification; DC noise target specification; PDN; USB I/O; USB transmitter performance; frequency 480 MHz; high-speed I/O; large supply noise; power distribution network; signal eye diagram; signal performance impact; signal sensitivity-to-supply noise; supply noise-to-signal performance; transistor model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521813
  • Filename
    6521813