Title :
A CMOS based logic driver design for a 16 × 16 multiplexer based read-out array for infrared microbolometers
Author :
Visser, Pieter Johannes ; Schoeman, Johan ; Du Plessis, Monuko
Author_Institution :
Dept. of Electr., Univ. of Pretoria, Tshwane, South Africa
Abstract :
Infrared imaging detectors require highly temperature sensitive sensors placed in a focal plane array. Due to the nature of these sensors, they can not simply be biased continuously, as this causes unwanted self heating that distorts the desired measurement. This is typically overcome by the use of pulse based biasing systems to reduce the time during which a sensor can measure incoming radiation, but this in turn requires a careful timing analysis and synchronisation in the design. This paper presents parts of the simulation design of a fully-integrated CMOS time-division analogue multiplexer circuit serving both as a biasing and a read-out circuit for a 16 times 16 array of uncooled microbolometers. The contribution and emphasis lies in the design of a control logic driver for a multiplexer based read-out circuit that not only ensures synchronous operation, but in doing so, also ensures that the sensors are biased for as short a period as possible. The initial design was completed for fabrication in a standard 0.35 mum CMOS process. Simulation results indicate a fully synchronous system, and the specific architecture implemented has reduced the biasing time of each element to less than 0.2% of the read-out time for an entire frame.
Keywords :
CMOS analogue integrated circuits; bolometers; driver circuits; focal planes; infrared detectors; multiplexing equipment; readout electronics; temperature sensors; time division multiplexing; CMOS based logic driver; CMOS time-division analogue multiplexer circuit; focal plane array; infrared imaging detectors; infrared microbolometers; multiplexer-based read-out array; pulse-based biasing systems; read-out circuit; temperature sensitive sensors; timing analysis; timing synchronisation; CMOS image sensors; CMOS logic circuits; Circuit simulation; Distortion measurement; Logic arrays; Logic design; Multiplexing; Pulse measurements; Sensor arrays; Temperature sensors;
Conference_Titel :
AFRICON, 2009. AFRICON '09.
Conference_Location :
Nairobi
Print_ISBN :
978-1-4244-3918-8
Electronic_ISBN :
978-1-4244-3919-5
DOI :
10.1109/AFRCON.2009.5308148