• DocumentCode
    2242028
  • Title

    Restrict Encoding for Mixed-Mode BIST

  • Author

    Hakmi, Abdul-Wahid ; Holst, Stefan ; Wunderlich, Hans-Joachim ; Schloffel, J. ; Hapke, Friedrich ; Glowatz, Andreas

  • Author_Institution
    Inst. fur Tech. Inf., Univ. Stuttgart, Stuttgart, Germany
  • fYear
    2009
  • fDate
    3-7 May 2009
  • Firstpage
    179
  • Lastpage
    184
  • Abstract
    Programmable mixed-mode BIST schemes combine pseudo-random pattern testing and deterministic test. This paper presents a synthesis technique for a mixed-mode BIST scheme which is able to exploit the regularities of a deterministic test pattern set for minimizing the hardware overhead and memory requirements. The scheme saves more than 50% hardware costs compared with the best schemes known so far while complete programmability is still preserved.
  • Keywords
    built-in self test; encoding; logic testing; encoding; hardware costs; programmable mixed-mode BIST; pseudo-random pattern testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Costs; Dictionaries; Encoding; Hardware; Shift registers; Very large scale integration; Deterministic BIST;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2009. VTS '09. 27th IEEE
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3598-2
  • Type

    conf

  • DOI
    10.1109/VTS.2009.43
  • Filename
    5116630