DocumentCode

2242245

Title

Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations

Author

Courtois, Bernard ; Visweswariah, Chandu

fYear

2009

fDate

3-7 May 2009

Firstpage

237

Lastpage

237

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2009. VTS '09. 27th IEEE

Conference_Location

Santa Cruz, CA, USA

ISSN

1093-0167

Print_ISBN

978-0-7695-3598-2

Type

conf

DOI

10.1109/VTS.2009.72

Filename

5116640