DocumentCode
2242273
Title
Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips
Author
Courtois, Bernard ; Shakouri, Ali
fYear
2009
fDate
3-7 May 2009
Firstpage
241
Lastpage
241
Keywords
Electronic packaging thermal management; High-resolution imaging; Liquid crystals; Microscopy; Optical attenuators; Optical imaging; Spatial resolution; Temperature; Thermal resistance; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location
Santa Cruz, CA, USA
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.73
Filename
5116641
Link To Document