DocumentCode
2242294
Title
Highly X-Tolerant Selective Compaction of Test Responses
Author
Mrugalski, G. ; Mukherjee, N. ; Rajski, J. ; Czysz, D. ; Tyszer, J.
Author_Institution
Mentor Graphics Corp., Wilsonville, OR, USA
fYear
2009
fDate
3-7 May 2009
Firstpage
245
Lastpage
250
Abstract
The paper presents a new scan chain selection scheme for response compaction. The proposed solution performs selective masking of scan chains and handles a wide range of unknown state profiles, such that all X states can be eliminated in a per-cycle mode while preserving high observability of scan cells that capture errors.
Keywords
fault tolerance; integrated circuit testing; X-tolerant selective compaction; response compaction; scan chain selection; selective masking; test data compression; Built-in self-test; Circuit testing; Compaction; Graphics; Logic testing; Observability; State feedback; Test data compression; USA Councils; Very large scale integration; X-masking; output compaction; scan chain selection; test data compression; unknown states;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.11
Filename
5116642
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