Improved Maker-fringe analysis for estimation of second-order nonlinearities of arrayed ZnO nanorods

Author

Kim, J.T. ; Lee, H.W. ; Lee, K.M. ; Lee, S. ; Koh, K.H. ; Rotermund, F.

Author_Institution

Div. of Energy Syst. Res., Ajou Univ., Suwon

fYear

2007

fDate

26-31 Aug. 2007

Firstpage

1

Lastpage

2

Abstract

Second harmonic Maker-fringe signals, measured for determination of second-order nonlinear coefficients of arrayed ZnO nanorods, were analyzed with an improved method. In this analysis, multiple reflections and interferences of fundamental and second harmonic waves were taken into account within ZnO nanorod layer, which thickness approaches the wavelength of the incident beam.

Keywords

II-VI semiconductors; light interference; light reflection; nanostructured materials; optical harmonic generation; wide band gap semiconductors; zinc compounds; Maker-fringe analysis; ZnO; arrayed nanorods; incident beam; multiple reflections; second harmonic Maker-fringe signals; second harmonic waves; second-order nonlinearities; Harmonic analysis; Indium tin oxide; Interference; Nanostructured materials; Nonlinear optics; Optical materials; Optical reflection; Semiconductor materials; Signal analysis; Zinc oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on

Conference_Location

Seoul

Print_ISBN

978-1-4244-1173-3

Electronic_ISBN

978-1-4244-1174-0

Type

conf

DOI

10.1109/CLEOPR.2007.4391319

Filename

4391319