Title :
Improved Maker-fringe analysis for estimation of second-order nonlinearities of arrayed ZnO nanorods
Author :
Kim, J.T. ; Lee, H.W. ; Lee, K.M. ; Lee, S. ; Koh, K.H. ; Rotermund, F.
Author_Institution :
Div. of Energy Syst. Res., Ajou Univ., Suwon
Abstract :
Second harmonic Maker-fringe signals, measured for determination of second-order nonlinear coefficients of arrayed ZnO nanorods, were analyzed with an improved method. In this analysis, multiple reflections and interferences of fundamental and second harmonic waves were taken into account within ZnO nanorod layer, which thickness approaches the wavelength of the incident beam.
Keywords :
II-VI semiconductors; light interference; light reflection; nanostructured materials; optical harmonic generation; wide band gap semiconductors; zinc compounds; Maker-fringe analysis; ZnO; arrayed nanorods; incident beam; multiple reflections; second harmonic Maker-fringe signals; second harmonic waves; second-order nonlinearities; Harmonic analysis; Indium tin oxide; Interference; Nanostructured materials; Nonlinear optics; Optical materials; Optical reflection; Semiconductor materials; Signal analysis; Zinc oxide;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391319
