• DocumentCode
    22425
  • Title

    Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction

  • Author

    Natsui, Masanori ; Suzuki, Daisuke ; Sakimura, Noboru ; Nebashi, Ryusuke ; Tsuji, Yukihide ; Morioka, Ayuka ; Sugibayashi, Tadahiko ; Miura, Shun ; Honjo, Hiroaki ; Kinoshita, Keizo ; Ikeda, Shoji ; Endoh, Tetsuo ; Ohno, Hideo ; Hanyu, Takahiro

  • Author_Institution
    Lab. for Brainware Syst., Tohoku Univ., Sendai, Japan
  • Volume
    50
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    476
  • Lastpage
    489
  • Abstract
    A magnetic tunnel junction (MTJ)-based logic-in-memory hardware accelerator LSI with cycle-based power gating is fabricated using a 90 nm MTJ/MOS process on a 300 mm wafer fabrication line for practical-scale, fully parallel motion-vector prediction, without wasted power dissipation. The proposed nonvolatile LSI is designed by establishing an automated design environment with MTJ-based logic-circuit IPs and peripheral assistant tools, as well as a precise MTJ device model produced by the fabricated test chips. Through the measurement results of the fabricated LSI, this study shows both the impact of the power-gating technique in a fine temporal granularity utilizing the non-volatility of the MTJ device and the effectiveness of the established automated design environment for designing random logic LSI using nonvolatile logic-in-memory.
  • Keywords
    CMOS logic circuits; large scale integration; magnetic tunnelling; random-access storage; MTJ-MOS process; automated design environment; cycle-based power gating; fine temporal granularity; hardware accelerator LSI; logic-circuit; magnetic tunnel junction; motion-vector prediction; nonvolatile logic-in-memory LSI; parallel motion vector prediction; peripheral assistant tools; random logic LSI; size 300 mm; size 90 nm; wafer fabrication line; wasted power dissipation; Computer architecture; Educational institutions; Integrated circuit modeling; Large scale integration; Magnetic tunneling; Microprocessors; Nonvolatile memory; Automated design environment; magnetic tunnel junction (MTJ); motion-vector prediction; nonvolatile logic-in-memory (NV-LIM); power gating; spin-transfer torque random access memory (STT-RAM);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2362853
  • Filename
    6942275