DocumentCode :
22425
Title :
Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction
Author :
Natsui, Masanori ; Suzuki, Daisuke ; Sakimura, Noboru ; Nebashi, Ryusuke ; Tsuji, Yukihide ; Morioka, Ayuka ; Sugibayashi, Tadahiko ; Miura, Shun ; Honjo, Hiroaki ; Kinoshita, Keizo ; Ikeda, Shoji ; Endoh, Tetsuo ; Ohno, Hideo ; Hanyu, Takahiro
Author_Institution :
Lab. for Brainware Syst., Tohoku Univ., Sendai, Japan
Volume :
50
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
476
Lastpage :
489
Abstract :
A magnetic tunnel junction (MTJ)-based logic-in-memory hardware accelerator LSI with cycle-based power gating is fabricated using a 90 nm MTJ/MOS process on a 300 mm wafer fabrication line for practical-scale, fully parallel motion-vector prediction, without wasted power dissipation. The proposed nonvolatile LSI is designed by establishing an automated design environment with MTJ-based logic-circuit IPs and peripheral assistant tools, as well as a precise MTJ device model produced by the fabricated test chips. Through the measurement results of the fabricated LSI, this study shows both the impact of the power-gating technique in a fine temporal granularity utilizing the non-volatility of the MTJ device and the effectiveness of the established automated design environment for designing random logic LSI using nonvolatile logic-in-memory.
Keywords :
CMOS logic circuits; large scale integration; magnetic tunnelling; random-access storage; MTJ-MOS process; automated design environment; cycle-based power gating; fine temporal granularity; hardware accelerator LSI; logic-circuit; magnetic tunnel junction; motion-vector prediction; nonvolatile logic-in-memory LSI; parallel motion vector prediction; peripheral assistant tools; random logic LSI; size 300 mm; size 90 nm; wafer fabrication line; wasted power dissipation; Computer architecture; Educational institutions; Integrated circuit modeling; Large scale integration; Magnetic tunneling; Microprocessors; Nonvolatile memory; Automated design environment; magnetic tunnel junction (MTJ); motion-vector prediction; nonvolatile logic-in-memory (NV-LIM); power gating; spin-transfer torque random access memory (STT-RAM);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2362853
Filename :
6942275
Link To Document :
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