• DocumentCode
    2242583
  • Title

    Characterization of Effective Laser Spots during Attacks in the Configuration of a Virtex-II FPGA

  • Author

    Canivet, G. ; Leveugle, R. ; Clédière, J. ; Valette, F. ; Renaudin, M.

  • Author_Institution
    TIMA Lab., Grenoble INP, Grenoble, France
  • fYear
    2009
  • fDate
    3-7 May 2009
  • Firstpage
    327
  • Lastpage
    332
  • Abstract
    SRAM-based FPGAs are an appealing platform to implement many systems, including secure ones. However, secure systems are subject to attacks and one of the main threats is fault-based attacks using lasers. The sensitivity of the configuration memory in a SRAM-based FPGA has to be studied in this context. This paper reports on the characterization of the effective laser spot, or effective sensitive area, with respect to the laser focus and to the attacked configuration bits. The test vehicle is a Virtex II FPGA. It is shown in particular that the initial value of the bit has a strong influence on the effective sensitive area of the spot. Such data can be used to better understand the actual effects of an attack and to design more efficient counter-measures. Also, it is shown that attacks based on single bit flips in the configuration are possible in practice even with relatively large laser spots.
  • Keywords
    SRAM chips; fault diagnosis; field programmable gate arrays; lasers; logic design; radiation hardening (electronics); security of data; SRAM; Virtex-II FPGA configuration; effective laser spot; effective sensitive; fault based attacks; Circuit faults; Cryptography; Dissolved gas analysis; Field programmable gate arrays; Indium phosphide; Laboratories; Protection; System testing; Vehicles; Very large scale integration; FPGA; SRAM-based; configuration errors; fault attack;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2009. VTS '09. 27th IEEE
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3598-2
  • Type

    conf

  • DOI
    10.1109/VTS.2009.19
  • Filename
    5116655