DocumentCode
2243097
Title
Patterning effect mitigation using complementary data for NRZ wavelength conversion with a SOA-MZI
Author
Wang, Gang ; Yang, Xuelin ; Weng, Qiwei ; Hu, Wei Sheng
Author_Institution
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear
2011
fDate
13-16 Nov. 2011
Firstpage
1
Lastpage
6
Abstract
A novel scheme of Non-Return-to-Zero (NRZ) all-optical wavelength conversion is proposed using a semiconductor optical amplifier based Mach-Zehnder interferometer (SOA-MZI), where the complementary NRZ data is used to mitigate SOA patterning effect. The performances of the wavelength converters are numerically evaluated in terms of the waveform, eye-diagram and Q factor of the output signals at 40 Gb/s, using a time-domain SOA model. It is shown that the new complementary scheme significantly improves the Q factor of the converted signal from 3.8 to 8.1, compared with the traditional scheme.
Keywords
Mach-Zehnder interferometers; Q-factor; optical wavelength conversion; semiconductor optical amplifiers; time-domain analysis; Mach-Zehnder interferometer; NRZ wavelength conversion; Q factor; SOA-MZI; all-optical wavelength conversion; complementary data; eye-diagram; nonreturn-to-zero; patterning effect mitigation; semiconductor optical amplifier; time-domain SOA model; Abstracts; Wavelength division multiplexing; NRZ format; patterning effect; semiconductor optical amplifiers; wavelength conversion;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications and Photonics Conference and Exhibition, 2011. ACP. Asia
Conference_Location
Shanghai
ISSN
2162-108X
Print_ISBN
978-0-8194-8961-6
Type
conf
DOI
10.1117/12.904084
Filename
6210662
Link To Document