Title :
Design of FIR filters with exceptional passband and stopband smoothness using a new transitional window
Author :
Roark, Rick M. ; Escabi, Monty
Author_Institution :
Dept. of Otolaryngology/Head & Neck Surg., New York Med. Coll., Valhalla, NY, USA
Abstract :
This paper demonstrates that FIR filters with excellent passband and stopband smoothness are obtained when sharp transition edges in the ideal filter are replaced with a spline. Although the filters are developed in the frequency domain, a convergence window is identified in the impulse response and compared to windows of popular FIR filters. Design formulae are provided that include parameters to adjust the magnitude response from having characteristics like the maximally-flat designs of Hermann and Kaiser to one having characteristics like the minimum-sidelobe energy approximations of Kaiser and Saramaki. The impulse response coefficients are more straightforward to obtain than these filter designs, while offering preferable response characteristics in many instances. By means of example, adjustment of the transitional parameter is shown to produce a filter response that rivals the stopband attenuation and transition width of prolate spheroidal designs. The filters are particularly suitable for accurate filtering and reconstruction of sampled physiologic and acoustic signals common to the health sciences but are also useful in other applications requiring very low passband and stopband errors
Keywords :
FIR filters; convergence; digital filters; filtering theory; low-pass filters; splines (mathematics); transient response; FIR filter design; convergence window; filter response; impulse response coefficients; magnitude response characteristics; passband smoothness; spline; stopband smoothness; transitional window; Attenuation; Band pass filters; Convolution; Filtering; Finite impulse response filter; Frequency; Passband; Prototypes; Smoothing methods; USA Councils;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.857035