Title :
Automatic Testing System for UHF Passive RFID Tag Performance
Author :
Zou Wen bin ; Wu Yun ; Zhao Yong
Author_Institution :
Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen
Abstract :
With the advancement of radio frequency identification technology, various RFID products are emerging in our life. More and more government agencies and retailers have realized the potential of RFID technology and have mandated or recommended their suppliers to attach RFID tags to their products. The tag performance highly determines implement of these mandates and recommendations. In this paper, we discuss an automatic testing system for UHF passive RFID tag performance. Both hardware and software architectures will be presented.
Keywords :
automatic testing; radiofrequency identification; telecommunication computing; UHF passive RFID tag performance; automatic testing system; hardware architectures; radio frequency identification technology; software architectures; tag performance; Automatic testing; Backscatter; Batteries; Benchmark testing; DH-HEMTs; Electromagnetic scattering; Passive RFID tags; RFID tags; Radiofrequency identification; Supply chains; RFID; automatic testing system; benchmarking; tag performance;
Conference_Titel :
Networking and Digital Society, 2009. ICNDS '09. International Conference on
Conference_Location :
Guiyang, Guizhou
Print_ISBN :
978-0-7695-3635-4
DOI :
10.1109/ICNDS.2009.100
