Title :
An exploratory analysis of system test data
Author :
Follenweider, R. ; Karcich, R. ; Knafl, G.J.
Author_Institution :
Storage Technol. Corp., Louisville, CO, USA
Abstract :
We conduct an exploratory data analysis of a specific system test data set that includes concomitant variables measuring aspects of test effort as well as the failure count and time variables considered in standard software reliability analyses. We consider a family of Poisson process models for which failure rates may depend on time as well as on the test effort variables. We analyze failure rates computed from this test data using least squares parameter estimation and model selection via the predicted residual sum of squares (PRESS)
Keywords :
data analysis; least squares approximations; software fault tolerance; software reliability; stochastic processes; PRESS; Poisson process models; exploratory analysis; exploratory data analysis; failure count; failure rates; least squares parameter estimation; model selection; predicted residual sum of squares; software reliability analyses; specific system test data set; system test data; time variables; Data analysis; Failure analysis; Least squares approximation; Measurement standards; Software measurement; Software reliability; Software standards; Software testing; System testing; Time measurement;
Conference_Titel :
Software Reliability Engineering, 1994. Proceedings., 5th International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-6665-X
DOI :
10.1109/ISSRE.1994.341344