DocumentCode
2243897
Title
Modelling an imperfect debugging phenomenon with testing effort
Author
Kapur, P.K. ; Grover, P.S. ; Younes, Said
Author_Institution
Dept. of Oper. Res., Delhi Univ., India
fYear
1994
fDate
6-9 Nov 1994
Firstpage
178
Lastpage
183
Abstract
A software reliability growth model (SRGM) based on non-homogeneous Poisson processes (NHPP) is developed. The model describes the relationship between the calendar time, the testing effort consumption and the error removal process under an imperfect debugging environment. The role of learning (gaining experience) with the progress of the testing phase is taken into consideration by assuming that the imperfect debugging probability is dependent on the current software error content. The model has the in-built flexibility of representing a wide range of growth curves. The model can be used to plan the amount of testing effort required to achieve a pre-determined target in terms of the number of errors removed in a given span of time
Keywords
error analysis; probability; program debugging; program testing; software reliability; calendar time; current software error content; error removal process; gaining experience; growth curves; imperfect debugging environment; imperfect debugging probability; learning; nonhomogeneous Poisson processes; pre-determined target; representational flexibility; software reliability growth model; testing effort consumption; testing phase progress; Calendars; Computer errors; Costs; Debugging; Software debugging; Software measurement; Software quality; Software reliability; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1994. Proceedings., 5th International Symposium on
Conference_Location
Monterey, CA
Print_ISBN
0-8186-6665-X
Type
conf
DOI
10.1109/ISSRE.1994.341371
Filename
341371
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