• DocumentCode
    2243897
  • Title

    Modelling an imperfect debugging phenomenon with testing effort

  • Author

    Kapur, P.K. ; Grover, P.S. ; Younes, Said

  • Author_Institution
    Dept. of Oper. Res., Delhi Univ., India
  • fYear
    1994
  • fDate
    6-9 Nov 1994
  • Firstpage
    178
  • Lastpage
    183
  • Abstract
    A software reliability growth model (SRGM) based on non-homogeneous Poisson processes (NHPP) is developed. The model describes the relationship between the calendar time, the testing effort consumption and the error removal process under an imperfect debugging environment. The role of learning (gaining experience) with the progress of the testing phase is taken into consideration by assuming that the imperfect debugging probability is dependent on the current software error content. The model has the in-built flexibility of representing a wide range of growth curves. The model can be used to plan the amount of testing effort required to achieve a pre-determined target in terms of the number of errors removed in a given span of time
  • Keywords
    error analysis; probability; program debugging; program testing; software reliability; calendar time; current software error content; error removal process; gaining experience; growth curves; imperfect debugging environment; imperfect debugging probability; learning; nonhomogeneous Poisson processes; pre-determined target; representational flexibility; software reliability growth model; testing effort consumption; testing phase progress; Calendars; Computer errors; Costs; Debugging; Software debugging; Software measurement; Software quality; Software reliability; Software systems; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1994. Proceedings., 5th International Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-8186-6665-X
  • Type

    conf

  • DOI
    10.1109/ISSRE.1994.341371
  • Filename
    341371