DocumentCode
2243973
Title
Testing applications using domain based testing and Sleuth
Author
Von Mayrhauser, Anneliese ; Walls, Jeff ; Mraz, Richard
Author_Institution
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
fYear
1994
fDate
6-9 Nov 1994
Firstpage
206
Lastpage
215
Abstract
Domain-based testing (DBT) is a test generation method based on two concepts from software reuse: domain analysis and domain modeling. Instead of using domain models for reuse, they serve as a structure to generate tests. In general, domain-based testing forms a family of test generation methods. Each member of the family defines a specialized domain analysis and domain model for each problem domain or class of software. To demonstrate these principles, we define a domain analysis and a domain model for systems with a command language interface. The analysis exploits information from the command language, and the domain model stores the syntactic and semantic information needed for test case generation. We develop a four-part test generation process model to support automated test generation. We also describe an interactive test generation tool called Sleuth. Sleuth supports domain-based testing, follows our test process model, and provides utilities to reuse test cases
Keywords
automatic test software; program testing; software reliability; software reusability; software tools; Sleuth; automated test generation; command language interface; domain analysis; domain based testing; domain modeling; interactive test generation tool; semantic information; software reuse; software test generation method; syntactic information; test case reuse utilities; test generation process model; test process model; Application software; Automatic testing; Command languages; Computer science; Information analysis; Libraries; Maintenance engineering; Software testing; Storage automation; System testing; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1994. Proceedings., 5th International Symposium on
Conference_Location
Monterey, CA
Print_ISBN
0-8186-6665-X
Type
conf
DOI
10.1109/ISSRE.1994.341375
Filename
341375
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