DocumentCode :
2244352
Title :
Formal verification of PowerPC arrays using symbolic trajectory evaluation
Author :
Pandey, Manish ; Raimi, Richard ; Beatty, Derek L. ; Bryant, Randal E.
Author_Institution :
Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1996
fDate :
3-7 Jun, 1996
Firstpage :
649
Lastpage :
654
Abstract :
Verifying memory arrays such as on-chip caches and register files is a difficult part of designing a microprocessor. Current tools cannot verify the equivalence of the arrays to their behavioral or RTL models, nor their correct functioning at the transistor level. It is infeasible to run the number of simulation cycles required, and most formal verification tools break down due to the enormous number of state-holding elements in the arrays. The formal method of symbolic trajectory evaluation (STE) appears to offer a solution, however, STE verifies that a circuit satisfies a formula in a carefully restricted temporal logic. For arrays, it requires only a number of variables approximately logarithmic in the number of memory locations. The circuit is modeled at the switch level, so the verification is done on the actual design. We have used STE to verify two arrays from PowerPC microprocessors: a register file, and a data cache tag unit. The tag unit contains over 12,000 latches. We believe it is the largest circuit to have been formally verified, without abstracting away significant detail, in the industry. We also describe an automated technique for identifying state-holding elements in the arrays, a technique which should greatly assist the widespread application of STE
Keywords :
Boolean functions; formal verification; logic design; microprocessor chips; temporal logic; PowerPC arrays; RTL models; data cache tag unit; formal verification; formal verification tools; memory arrays verification; memory locations; microprocessor; on-chip caches; register file; register files; simulation cycles; state-holding elements; symbolic trajectory evaluation; temporal logic; Boolean functions; Circuit simulation; Design automation; Explosions; Formal verification; Latches; Logic arrays; Logic circuits; Permission; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference Proceedings 1996, 33rd
Conference_Location :
Las Vegas, NV
ISSN :
0738-100X
Print_ISBN :
0-7803-3294-6
Type :
conf
DOI :
10.1109/DAC.1996.545655
Filename :
545655
Link To Document :
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